Publications:

Journal Papers: 

• S. Banik, S. Roy and B. Sen, "Application-Dependent Testing of FPGA Interconnect Network," in IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 27, no. 10, pp. 2296-2304, Oct. 2019. [SCI]  

• S. Banik, S. Roy and B. Sen, “An Integrated Framework for Application Independent Testing of FPGA Interconnect” Journal of Electronic Testing, vol. 35, no.5, pp. 729–740 Oct. 2019. [SCI]  

• R. Rajak, S. Banik, “A Comprehensive Survey on Challenges and new directions in hardware Security ” Educational Administration : Theory and Practice, Jun. 2024. [SCOPUS] 

• S. Banik, R. Rajak,“Fake Review Detection: Taxonomies, Benchmarks, and Intent Modeling Frameworks” [ Accepted, Journal of Information Systems Engineering and Management] [SCOPUS]. 

Conference Papers : 

• S. Banik, S. Roy and B. Sen, "Test Configuration Generation for Different FPGA Architectures for Application Independent Testing," 2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID), Delhi, NCR, India, pp. 395-400, 2019. 

• S. Banik and S. Roy, "Application Dependent Testing of FPGA Interconnect Using Satisfiability Modulo Theory," 2018 3rd International Conference for Convergence in Technology (I2CT), Pune, pp. 1-5, 2018.  

• S. Misra, A. Mondal, S. Banik, M. Khatua, S. Bera and M. S. Obaidat, "Residential Energy Management in Smart Grid: A Markov Decision Process-Based Approach," 2013 IEEE International Conference on Green Computing and Communications, Beijing, pp. 1152- 1157, 2013.  

• S. Das and S. Banik,” Spiking Neural Network Model for Predicting Stability in Decentralized Smart Grid Control Systems”, 4th International Conference on Current Research in Engineering and Technology, Feb, 2025.  

FDP Organized: 

• Online Faculty Development Programme (FDP) on “Machine Learning (ML) and Deep Learning (DL) Techniques in collaboration with E&ICT Academy, IIT Guwahati approved by Ministry of Electronics and Information Technology (MeitY), Government of India. (March 24th to 28th, 2025, Brainware University). 

Specializations: 

• VLSI Testing

• Smart Grid

• Hardware Testing